Contact and contactless porous silicon parameter measurement techniques
نویسندگان
چکیده
منابع مشابه
Contactless Characterization of Silicon Wafers
Contactless measurements are attractive and more commonly used because they do not contaminate the sample and generally do not require sample preparation. After an outline of the more common contactless characterization techniques, I will discuss a few of these in more detail. In particular resistivity or doping density profiling, minority carrier lifetime, stress, temperature, layer thickness,...
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It is often necessary to be able to create computer models from physical objects. This is often done for the purposes of reverse engineering, or archival. Many of the contact methods, such as callipers or Coordinate Measuring Machines, are unsuitable for use in areas where the material is delicate. There are numerous techniques that are capable of performing quick accurate measurements of surfa...
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Background: Workers who use hand-held vibrating tools may experience finger blanching attacks due to episodic vasospasm in the digital vessels. In occupational medicine, the pathological consequences to the exposure to handtransmitted vibration are known as vibration induced white finger (VWF). In many cases, workers are recommended to use anti-vibration gloves and a standard procedure (ISO 108...
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Title of Thesis: CONTACTLESS SPECTRAL-DEPENDENT MEASUREMENT OF BULK LIFETIME AND SURFACE RECOMBINATION VELOCITY IN SILICON PHOTOVOLTAIC MATERIALS John Frederick Roller, Master of Science 2016 Thesis Directed By: Dr. Mario Dagenais, ECE Charge carrier lifetime measurements in bulk or unfinished photovoltaic (PV) materials allow for a more accurate estimate of power conversion efficiency in compl...
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ژورنال
عنوان ژورنال: Modern Electronic Materials
سال: 2018
ISSN: 2452-1779,2452-2449
DOI: 10.3897/j.moem.4.4.39503